bookCambridge University Press eBooksAug 6, 2009PTClosed access

Fundamentals of Modern VLSI Devices

University of California, San Diego · IBM Research - Thomas J. Watson Research Center

Indexed incrossref

Abstract

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the…

Citation impact

2,906
total citations
FWCI
177.52
Percentile
100%
References
391
Citations per year

Authors

2

Topics & keywords

Keywords
  • Very-large-scale integration
  • Microelectronics
  • Bipolar junction transistor
  • CMOS
  • Computer science
  • Scaling
  • Transistor
  • Electrical engineering
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