Tin Disulfide—An Emerging Layered Metal Dichalcogenide Semiconductor: Materials Properties and Device Characteristics
Brookhaven National Laboratory · University of Arizona · +2 more institutions
Abstract
Layered metal dichalcogenides have attracted significant interest as a family of single- and few-layer materials that show new physics and are of interest for device applications. Here, we report a comprehensive characterization of the properties of tin disulfide (SnS2), an emerging semiconducting metal dichalcogenide, down to the monolayer limit. Using flakes exfoliated from layered bulk crystals, we establish the characteristics of single- and few-layer SnS2 in optical and atomic force microscopy, Raman spectroscopy and transmission electron microscopy. Band structure measurements in conjunction with ab initio calculations and photoluminescence spectroscopy show that SnS2 is an indirect bandgap semiconductor…
Citation impact
- FWCI
- 14.45
- Percentile
- 100%
- References
- 77
Authors
11Topics & keywords
- Materials science
- Raman spectroscopy
- Optoelectronics
- Monolayer
- Tin
- Semiconductor
- Band gap
- Molybdenum disulfide