articleACS NanoSep 23, 2014Closed access

Tin Disulfide—An Emerging Layered Metal Dichalcogenide Semiconductor: Materials Properties and Device Characteristics

Brookhaven National Laboratory · University of Arizona · +2 more institutions

PubMed
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Abstract

Layered metal dichalcogenides have attracted significant interest as a family of single- and few-layer materials that show new physics and are of interest for device applications. Here, we report a comprehensive characterization of the properties of tin disulfide (SnS2), an emerging semiconducting metal dichalcogenide, down to the monolayer limit. Using flakes exfoliated from layered bulk crystals, we establish the characteristics of single- and few-layer SnS2 in optical and atomic force microscopy, Raman spectroscopy and transmission electron microscopy. Band structure measurements in conjunction with ab initio calculations and photoluminescence spectroscopy show that SnS2 is an indirect bandgap semiconductor…

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539
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14.45
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100%
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77
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Authors

11

Topics & keywords

Keywords
  • Materials science
  • Raman spectroscopy
  • Optoelectronics
  • Monolayer
  • Tin
  • Semiconductor
  • Band gap
  • Molybdenum disulfide
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