Mechanism of high-resolution STM/AFM imaging with functionalized tips
Czech Academy of Sciences, Institute of Physics · Czech Academy of Sciences · +3 more institutions
Abstract
High-resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical STM/AFM model, which takes into account the relaxation of the probe due to the tip-sample interaction. We demonstrate that the model is able to reproduce very well not only the experimental intra- and intermolecular contrasts, but also their evolution upon tip approach. At close distances, the simulations unveil a significant probe particle relaxation towards local minima of the interaction potential. This effect is responsible for the sharp submolecular resolution observed in…
Citation impact
- FWCI
- 25.28
- Percentile
- 100%
- References
- 35
Authors
6- PHProkop HapalaCorresponding
Czech Academy of Sciences, Institute of Physics, Czech Academy of Sciences
- GAG. A. Kichin
Czech Academy of Sciences, Institute of Physics, Jülich Aachen Research Alliance, Czech Academy of Sciences, Forschungszentrum Jülich
- CWChristian Wagner
Forschungszentrum Jülich, Jülich Aachen Research Alliance, Czech Academy of Sciences, Czech Academy of Sciences, Institute of Physics
- FSF. Stefan Tautz
Forschungszentrum Jülich, Czech Academy of Sciences, Institute of Physics, Czech Academy of Sciences, Jülich Aachen Research Alliance
- RTRuslan Temirov
Czech Academy of Sciences, Jülich Aachen Research Alliance, Forschungszentrum Jülich, Czech Academy of Sciences, Institute of Physics
Topics & keywords
- Materials science
- Atomic force microscopy
- Mechanism (biology)
- Nanotechnology
- Scanning tunneling microscope
- Resolution (logic)
- High resolution
- Computer science
- Affordable and clean energy