articleThin Solid FilmsJan 9, 2005Closed access

Fundamental understanding and modeling of reactive sputtering processes

Uppsala University

Indexed incrossref

Abstract

No abstract available for this paper.

Citation impact

695
total citations
FWCI
55.74
Percentile
100%
References
22
Citations per year

Authors

2

Topics & keywords

Keywords
  • Sputtering
  • Deposition (geology)
  • Stoichiometry
  • Process engineering
  • Process (computing)
  • Materials science
  • Process control
  • Characterization (materials science)
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Funding