articleSurface Science ReportsNov 26, 2010Closed access

Kelvin probe force microscopy and its application

WMWilhelm MelitzJSJian ShenACAndrew C. KummelSLSangyeob Lee

University of California, San Diego

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Abstract

No abstract available for this paper.

Citation impact

1,632
total citations
FWCI
18.03
Percentile
100%
References
108
Citations per year

Authors

4

Topics & keywords

Topics
Keywords
  • Kelvin probe force microscope
  • Volta potential
  • Microscopy
  • Work function
  • Scanning probe microscopy
  • Nanotechnology
  • Chemistry
  • Photoemission electron microscopy
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