articleMicroelectronics ReliabilityAug 5, 2004Closed access

A comprehensive model of PMOS NBTI degradation

MAMd Ashraful AlamSMSouvik Mahapatra

Indian Institute of Technology Bombay

Indexed incrossref

Abstract

No abstract available for this paper.

Citation impact

759
total citations
FWCI
32.54
Percentile
100%
References
38
Citations per year

Authors

2

Topics & keywords

Topics
Keywords
  • Negative-bias temperature instability
  • PMOS logic
  • Reliability (semiconductor)
  • Degradation (telecommunications)
  • Diffusion
  • Generalization
  • Reliability engineering
  • Computer science
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