Wavelet analysis of extended x-ray absorption fine structure data
Helmholtz-Zentrum Dresden-Rossendorf · Institute of Microelectronics Technology and High Purity Materials
Abstract
Fourier transform (FT) is a fundamental step for the data reduction and interpretation of extended x-ray absorption fine structure (EXAFS) spectra. The FT separates backscattering atoms by their radial distance from the absorbing atom (so-called shells). We suggest to routinely complement the FT by a wavelet transform (WT), which provides not only radial distance resolution, but resolves in $k$ space. This information eases the discrimination of atoms by their elemental nature, especially if these atoms are at the same distance. We present an in-depth analysis of the Morlet wavelet, which has specific advantages for EXAFS analysis, including the possibility to estimate Morlet parameter values optimized either…
Citation impact
- FWCI
- 1.83
- Percentile
- 100%
- References
- 29
Authors
3Topics & keywords
- Morlet wavelet
- X-ray absorption fine structure
- Extended X-ray absorption fine structure
- Fourier transform
- Scattering
- Absorption (acoustics)
- Resolution (logic)
- Materials science
- Reduced inequalities