articlePhysical Review BMar 30, 2005Closed access

Wavelet analysis of extended x-ray absorption fine structure data

Helmholtz-Zentrum Dresden-Rossendorf · Institute of Microelectronics Technology and High Purity Materials

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Abstract

Fourier transform (FT) is a fundamental step for the data reduction and interpretation of extended x-ray absorption fine structure (EXAFS) spectra. The FT separates backscattering atoms by their radial distance from the absorbing atom (so-called shells). We suggest to routinely complement the FT by a wavelet transform (WT), which provides not only radial distance resolution, but resolves in $k$ space. This information eases the discrimination of atoms by their elemental nature, especially if these atoms are at the same distance. We present an in-depth analysis of the Morlet wavelet, which has specific advantages for EXAFS analysis, including the possibility to estimate Morlet parameter values optimized either…

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Topics & keywords

Keywords
  • Morlet wavelet
  • X-ray absorption fine structure
  • Extended X-ray absorption fine structure
  • Fourier transform
  • Scattering
  • Absorption (acoustics)
  • Resolution (logic)
  • Materials science
UN Sustainable Development Goals
  • Reduced inequalities
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