reviewNature NanotechnologyApr 1, 2012GREEN OA

The emergence of multifrequency force microscopy

Centro Nacional de Microelectrónica · Consejo Superior de Investigaciones Científicas · +1 more institution

PubMed
Indexed incrossrefpubmed

Abstract

No abstract available for this paper.

Citation impact

576
total citations
FWCI
35.87
Percentile
100%
References
110
Citations per year

Authors

2

Topics & keywords

Keywords
  • Cantilever
  • Microscopy
  • Non-contact atomic force microscopy
  • Atomic force acoustic microscopy
  • Deflection (physics)
  • Materials science
  • Conductive atomic force microscopy
  • Magnetic force microscope
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