The emergence of multifrequency force microscopy
Centro Nacional de Microelectrónica · Consejo Superior de Investigaciones Científicas · +1 more institution
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576
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Topics
Keywords
- Cantilever
- Microscopy
- Non-contact atomic force microscopy
- Atomic force acoustic microscopy
- Deflection (physics)
- Materials science
- Conductive atomic force microscopy
- Magnetic force microscope
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