reviewJournal of Applied PhysicsSep 1, 2010Closed access

High aspect ratio silicon etch: A review

Applied Materials (United States)

Indexed incrossref

Abstract

High aspect ratio (HAR) silicon etch is reviewed, including commonly used terms, history, main applications, different technological methods, critical challenges, and main theories of the technologies. Chronologically, HAR silicon etch has been conducted using wet etch in solution, reactive ion etch (RIE) in low density plasma, single-step etch at cryogenic conditions in inductively coupled plasma (ICP) combined with RIE, time-multiplexed deep silicon etch in ICP-RIE configuration reactor, and single-step etch in high density plasma at room or near room temperature. Key specifications are HAR, high etch rate, good trench sidewall profile with smooth surface, low aspect ratio dependent etch, and low etch…

Citation impact

716
total citations
FWCI
23.24
Percentile
100%
References
121
Citations per year

Authors

3

Topics & keywords

Keywords
  • Etch pit density
  • Silicon
  • Materials science
  • Reactive-ion etching
  • Etching (microfabrication)
  • Inductively coupled plasma
  • Passivation
  • Optoelectronics
UN Sustainable Development Goals
  • Industry, innovation and infrastructure
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