Abstract
High aspect ratio (HAR) silicon etch is reviewed, including commonly used terms, history, main applications, different technological methods, critical challenges, and main theories of the technologies. Chronologically, HAR silicon etch has been conducted using wet etch in solution, reactive ion etch (RIE) in low density plasma, single-step etch at cryogenic conditions in inductively coupled plasma (ICP) combined with RIE, time-multiplexed deep silicon etch in ICP-RIE configuration reactor, and single-step etch in high density plasma at room or near room temperature. Key specifications are HAR, high etch rate, good trench sidewall profile with smooth surface, low aspect ratio dependent etch, and low etch…
Citation impact
716
total citations
- FWCI
- 23.24
- Percentile
- 100%
- References
- 121
Citations per year
Authors
3Topics & keywords
Topics
Keywords
- Etch pit density
- Silicon
- Materials science
- Reactive-ion etching
- Etching (microfabrication)
- Inductively coupled plasma
- Passivation
- Optoelectronics
UN Sustainable Development Goals
- Industry, innovation and infrastructure
No related works found for this paper.