Metal–Oxide RRAM
Stanford University · Industrial Technology Research Institute · +3 more institutions
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Abstract
In this paper, recent progress of binary metal–oxide resistive switching random access memory (RRAM) is reviewed. The physical mechanism, material properties, and electrical characteristics of a variety of binary metal–oxide RRAM are discussed, with a focus on the use of RRAM for nonvolatile memory application. A review of recent development of large-scale RRAM arrays is given. Issues such as uniformity, endurance, retention, multibit operation, and scaling trends are discussed.
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2,655
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- FWCI
- 106.15
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- 100%
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- 158
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Authors
9Topics & keywords
Topics
Keywords
- Resistive random-access memory
- Oxide
- Materials science
- Non-volatile memory
- Data retention
- Scaling
- Nanotechnology
- Metal
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