articleProceedings of the IEEEMay 25, 2012Closed access

Metal–Oxide RRAM

Stanford University · Industrial Technology Research Institute · +3 more institutions

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Abstract

In this paper, recent progress of binary metal–oxide resistive switching random access memory (RRAM) is reviewed. The physical mechanism, material properties, and electrical characteristics of a variety of binary metal–oxide RRAM are discussed, with a focus on the use of RRAM for nonvolatile memory application. A review of recent development of large-scale RRAM arrays is given. Issues such as uniformity, endurance, retention, multibit operation, and scaling trends are discussed.

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