Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors
University of Tsukuba · National Institute for Materials Science · +6 more institutions
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Abstract
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684
total citations
- FWCI
- 35.02
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- 100%
- References
- 54
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Authors
18- SFShigefusa F. ChichibuCorresponding
University of Tsukuba
- AUAkira Uedono
University of Tsukuba, National Institute for Materials Science
- TOTakeyoshi Onuma
Japan Science and Technology Agency, University of Tsukuba
- BAB. A. Haskell
Japan Science and Technology Agency, University of California, Santa Barbara
- ACArpan Chakraborty
University of California, Santa Barbara
Topics & keywords
Topics
Keywords
- Light-emitting diode
- Materials science
- Exciton
- Semiconductor
- Radiative transfer
- Optoelectronics
- Non-radiative recombination
- Spontaneous emission
UN Sustainable Development Goals
- Industry, innovation and infrastructure
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