articleNatureFeb 28, 2007Closed access

Chemical identification of individual surface atoms by atomic force microscopy

YSYoshiaki SugimotoPJPablo Jauralde PouMAMasayuki AbePJPavel Jelı́nekRPRúben Pérez

Osaka University · Universidad Autónoma de Madrid · +3 more institutions

PubMed
Indexed incrossrefpubmed

Abstract

No abstract available for this paper.

Citation impact

762
total citations
FWCI
44.91
Percentile
100%
References
28
Citations per year

Authors

7

Topics & keywords

Topics
Keywords
  • Conductive atomic force microscopy
  • Semiconductor
  • Silicon
  • Nanotechnology
  • Scanning tunneling microscope
  • Materials science
  • Magnetic force microscope
  • Kelvin probe force microscope
No related works found for this paper.