articleUltramicroscopyNov 16, 2005Closed access

High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

AWA.J. WilkinsonGMGraham MeadenDJD. J. Dingley

University of Oxford · At Bristol · +1 more institution

PubMed
Indexed incrossrefpubmed

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674
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3

Topics & keywords

Topics
Keywords
  • Electron backscatter diffraction
  • Materials science
  • Optics
  • Diffraction
  • Crystallography
  • Resolution (logic)
  • Chemistry
  • Physics
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