Complex Refractive Index Spectra of CH 3 NH 3 PbI 3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and Spectrophotometry

The complex refractive index (dielectric function) of planar CH3NH3PbI3 thin films at room temperature is investigated by variable angle spectroscopic ellipsometry and spectrophotometry. Knowledge of the complex refractive index is essential for designing photonic devices based on CH3NH3PbI3 thin films such as solar cells, light-emitting diodes, or lasers. Because the directly measured quantities (reflectance, transmittance, and ellipsometric spectra) are inherently affected by multiple reflections, the complex refractive index has to be determined indirectly by fitting a model dielectric function to the experimental spectra. We model the dielectric function according to the Forouhi-Bloomer formulation with…

• JA
  Javna Agencija za Raziskovalno Dejavnost RS

  Award: P2-0197