articleNano LettersFeb 28, 2004Closed access

Piezoelectric Characterization of Individual Zinc Oxide Nanobelt Probed by Piezoresponse Force Microscope

Georgia Institute of Technology · University of Pittsburgh

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Abstract

Piezoresponse force microscopy (PFM) is used to measure the effective piezoelectric coefficient (d33) of an individual (0001) surface dominated zinc oxide nanobelt lying on a conductive surface. Based on references of bulk (0001) ZnO and x-cut quartz, the effective piezoelectric coefficient d33 of ZnO nanobelt is found to be frequency dependent and varies from 14.3 pm/V to 26.7 pm/V, which is much larger than that of the bulk (0001) ZnO of 9.93 pm/V. The results support the application of ZnO nanobelts as nanosensors and nanoactuators.

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Authors

3

Topics & keywords

Keywords
  • Piezoelectricity
  • Nanosensor
  • Piezoresponse force microscopy
  • Materials science
  • Zinc
  • Piezoelectric coefficient
  • Nanotechnology
  • Characterization (materials science)
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