articleMicroelectronics ReliabilityApr 1, 2002Closed access

Selected failure mechanisms of modern power modules

MCMauro Ciappa

ETH Zurich

Indexed incrossref

Abstract

No abstract available for this paper.

Citation impact

964
total citations
FWCI
1.72
Percentile
100%
References
26
Citations per year

Authors

1

Topics & keywords

Topics
Keywords
  • Compendium
  • Reliability engineering
  • Reliability (semiconductor)
  • Engineering
  • Power module
  • Electrical engineering
  • Traction (geology)
  • Physics of failure
UN Sustainable Development Goals
  • Affordable and clean energy
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