A combined Importance Sampling and Kriging reliability method for small failure probabilities with time-demanding numerical models
Institut Français · Université Clermont Auvergne · +3 more institutions
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Abstract
No abstract available for this paper.
Citation impact
650
total citations
- FWCI
- 12.31
- Percentile
- 100%
- References
- 46
Citations per year
Authors
4- BEBenjamin EchardCorresponding
Institut Français, Université Clermont Auvergne
- NGNicolas Gayton
Institut Français, Université Clermont Auvergne
- MLMaurice Lemaire
Université Clermont Auvergne, Institut Français
- NRNicolas Relun
Sorbonne Université, Centre National de la Recherche Scientifique, École Normale Supérieure Paris-Saclay
Topics & keywords
Topics
Keywords
- Kriging
- Reliability (semiconductor)
- Importance sampling
- Monte Carlo method
- Sampling (signal processing)
- Computation
- Computer science
- Metamodeling
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