articleNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and AtomsOct 5, 2009Closed access

Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction

LLLuca Lutterotti

University of Trento

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Abstract

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Topics & keywords

Topics
Keywords
  • Diffraction
  • Texture (cosmology)
  • Crystallite
  • Materials science
  • Thin film
  • Optics
  • Point (geometry)
  • Cover (algebra)
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