Atom-chip-based generation of entanglement for quantum metrology
Ludwig-Maximilians-Universität München · Max Planck Institute of Quantum Optics · +3 more institutions
Indexed inarxivcrossrefpubmed
Abstract
No abstract available for this paper.
Citation impact
863
total citations
- FWCI
- 41.05
- Percentile
- 100%
- References
- 43
Citations per year
Authors
6- MFMax F. RiedelCorresponding
Ludwig-Maximilians-Universität München
- PBPascal Böhi
Ludwig-Maximilians-Universität München, Max Planck Institute of Quantum Optics
- YLYun Li
East China Normal University, Laboratoire Kastler Brossel
- TWTheodor W. Hänsch
Max Planck Institute of Quantum Optics, Ludwig-Maximilians-Universität München
- ASAlice Sinatra
Laboratoire Kastler Brossel
Topics & keywords
Topics
Keywords
- Quantum metrology
- Quantum entanglement
- Quantum sensor
- Physics
- Quantum technology
- Atom interferometer
- Quantum mechanics
- Quantum
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