Three-dimensional integrated circuits
IBM Research - Thomas J. Watson Research Center · IBM (United States)
Abstract
Three-dimensional (3D) integrated circuits (ICs), which contain multiple layers of active devices, have the potential to dramatically enhance chip performance, functionality, and device packing density. They also provide for microchip architecture and may facilitate the integration of heterogeneous materials, devices, and signals. However, before these advantages can be realized, key technology challenges of 3D ICs must be addressed. More specifically, the processes required to build circuits with multiple layers of active devices must be compatible with current state-of-the-art silicon processing technology. These processes must also show manufacturability, i.e., reliability, good yield, maturity, and…
Citation impact
- FWCI
- 43.28
- Percentile
- 100%
- References
- 51
Authors
11- AWAnna W. TopolCorresponding
IBM Research - Thomas J. Watson Research Center
- DCDouglas Charles La Tulipe
IBM (United States), IBM Research - Thomas J. Watson Research Center
- LSL. Shi
IBM (United States), IBM Research - Thomas J. Watson Research Center
- DFD.J. Frank
IBM (United States), IBM Research - Thomas J. Watson Research Center
- KBK. Bernstein
IBM (United States), IBM Research - Thomas J. Watson Research Center
Topics & keywords
- Integrated circuit
- Interconnection
- Wafer
- Design for manufacturability
- Electronic circuit
- Layer (electronics)
- Wafer bonding
- Process (computing)
- Industry, innovation and infrastructure