articleCIRP AnnalsJan 1, 2011Closed access

Computed tomography for dimensional metrology

JKJean‐Pierre KruthMBMarkus BartscherSCSimone CarmignatoRSRobert SchmittLDLeonardo De Chiffre

KU Leuven · Physikalisch-Technische Bundesanstalt · +4 more institutions

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Abstract

No abstract available for this paper.

Citation impact

670
total citations
FWCI
19.19
Percentile
100%
References
68
Citations per year

Authors

6

Topics & keywords

Topics
Keywords
  • Metrology
  • Traceability
  • Dimensional metrology
  • Quality (philosophy)
  • Coordinate-measuring machine
  • Computer science
  • Engineering
  • Computed tomography
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