A survey of combinatorial testing

Combinatorial Testing (CT) can detect failures triggered by interactions of parameters in the Software Under Test (SUT) with a covering array test suite generated by some sampling mechanisms. It has been an active field of research in the last twenty years. This article aims to review previous work on CT, highlights the evolution of CT, and identifies important issues, methods, and applications of CT, with the goal of supporting and directing future practice and research in this area. First, we present the basic concepts and notations of CT. Second, we classify the research on CT into the following categories: modeling for CT, test suite generation, constraints, failure diagnosis, prioritization, metric,…

• NN
  National Natural Science Foundation of China

  Award: 6.08E+23
• MO
  Ministry of Science and Technology of the People's Republic of China

  Award: 2008AA01Z1432009AA01Z147