A buckling-based metrology for measuring the elastic moduli of polymeric thin films
National Institute of Standards and Technology · DEVCOM Army Research Laboratory · +3 more institutions
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Abstract
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Citation impact
1,343
total citations
- FWCI
- 78.98
- Percentile
- 100%
- References
- 33
Citations per year
Authors
10- CMChristopher M. StaffordCorresponding
National Institute of Standards and Technology
- CHChristopher Harrison
National Institute of Standards and Technology
- KLKathryn L. Beers
National Institute of Standards and Technology
- AKAlamgir Karim
National Institute of Standards and Technology
- EJEric J. Amis
National Institute of Standards and Technology
Topics & keywords
Topics
Keywords
- Materials science
- Thin film
- Buckling
- Elastic modulus
- Composite material
- Nanometre
- Polymer
- Nanoscopic scale
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