Advanced scanning probe lithography
Instituto de Ciencia de Materiales de Madrid · IBM (United States) · +1 more institution
Indexed inarxivcrossrefpubmed
Abstract
No abstract available for this paper.
Citation impact
651
total citations
- FWCI
- 38.14
- Percentile
- 100%
- References
- 130
Citations per year
Authors
3Topics & keywords
Topics
Keywords
- Lithography
- Nanotechnology
- Materials science
- Scanning probe microscopy
- Optoelectronics
No related works found for this paper.