articleAIAA JournalSep 18, 2008Closed access

Efficient Global Reliability Analysis for Nonlinear Implicit Performance Functions

Vanderbilt University · Sandia National Laboratories

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Abstract

Many engineering applications are characterized by implicit response functions that are expensive to evaluate and sometimes nonlinear in their behavior, making reliability analysis difficult. This paper develops an efficient reliability analysis method that accurately characterizes the limit state throughout the random variable space. The method begins with a Gaussian process model built from a very small number of samples, and then adaptively chooses where to generate subsequent samples to ensure that the model is accurate in the vicinity of the limit state. The resulting Gaussian process model is then sampled using multimodal adaptive importance sampling to calculate the probability of exceeding (or failing…

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1,100
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11.21
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100%
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Authors

5

Topics & keywords

Keywords
  • Limit (mathematics)
  • Reliability (semiconductor)
  • Nonlinear system
  • Computer science
  • Gaussian
  • Limit state design
  • Random variable
  • Gaussian process
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