Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection
Troy University · Rensselaer Polytechnic Institute · +3 more institutions
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Abstract
No abstract available for this paper.
Citation impact
1,183
total citations
- FWCI
- 34.01
- Percentile
- 100%
- References
- 30
Citations per year
Authors
8- JXJingtian Xi
Troy University, Rensselaer Polytechnic Institute, Constellation Pharmaceuticals (United States)
- MSM. Schubert
Constellation Pharmaceuticals (United States), Rensselaer Polytechnic Institute, Troy University
- JKJong Kyu Kim
Constellation Pharmaceuticals (United States), Rensselaer Polytechnic Institute, Troy University
- EFE. Fred SchubertCorresponding
Troy University, Constellation Pharmaceuticals (United States), Rensselaer Polytechnic Institute
- MCMinfeng Chen
National Taiwan University, Rensselaer Polytechnic Institute, Constellation Pharmaceuticals (United States)
Topics & keywords
Topics
Keywords
- Refractive index
- Optics
- Materials science
- Fresnel equations
- Broadband
- Optoelectronics
- Reflection (computer programming)
- Fabrication
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