Breaking the Speed Limits of Phase-Change Memory
Agency for Science, Technology and Research · Data Storage Institute · +3 more institutions
Abstract
Phase-change random-access memory (PCRAM) is one of the leading candidates for next-generation data-storage devices, but the trade-off between crystallization (writing) speed and amorphous-phase stability (data retention) presents a key challenge. We control the crystallization kinetics of a phase-change material by applying a constant low voltage via prestructural ordering (incubation) effects. A crystallization speed of 500 picoseconds was achieved, as well as high-speed reversible switching using 500-picosecond pulses. Ab initio molecular dynamics simulations reveal the phase-change kinetics in PCRAM devices and the structural origin of the incubation-assisted increase in crystallization speed. This paves…
Citation impact
- FWCI
- 23.10
- Percentile
- 100%
- References
- 43
Authors
8- DKDesmond K. LokeCorresponding
Agency for Science, Technology and Research, Data Storage Institute, National University of Singapore, University of Cambridge
- THT. H. LeeCorresponding
University of Cambridge
- WJW. J. Wang
Agency for Science, Technology and Research, Data Storage Institute
- LSLu ShiCorresponding
Agency for Science, Technology and Research, Data Storage Institute
- RZRong Zhao
Agency for Science, Technology and Research, Data Storage Institute
Topics & keywords
- Amorphous solid
- Materials science
- Phase (matter)
- Phase-change memory
- Transmission electron microscopy
- Electric field
- Condensed matter physics
- Crystal (programming language)
- Affordable and clean energy