Finite deformation mechanics in buckled thin films on compliant supports

We present detailed experimental and theoretical studies of the mechanics of thin buckled films on compliant substrates. In particular, accurate measurements of the wavelengths and amplitudes in structures that consist of thin, single-crystal ribbons of silicon covalently bonded to elastomeric substrates of poly(dimethylsiloxane) reveal responses that include wavelengths that change in an approximately linear fashion with strain in the substrate, for all values of strain above the critical strain for buckling. Theoretical reexamination of this system yields analytical models that can explain these and other experimental observations at a quantitative level. We show that the resulting mechanics has many…

• NS
  National Science Foundation

  Awards: DEFG02-91ER45439, CMMI-0700440, 0328162, 0700440
• UD
  U.S. Department of Energy

  Award: DEFG02-91ER45439
• NN
  National Natural Science Foundation of China
• UO
  University of Illinois at Urbana-Champaign
• DO
  Division of Materials Research
• DO
  Division of Civil, Mechanical and Manufacturing Innovation