articleIEEE Transactions on Neural NetworksDec 10, 2009Closed access

OP-ELM: Optimally Pruned Extreme Learning Machine

Laboratoire d’Informatique et Systèmes · Helsinki Institute for Information Technology · +5 more institutions

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Abstract

In this brief, the optimally pruned extreme learning machine (OP-ELM) methodology is presented. It is based on the original extreme learning machine (ELM) algorithm with additional steps to make it more robust and generic. The whole methodology is presented in detail and then applied to several regression and classification problems. Results for both computational time and accuracy (mean square error) are compared to the original ELM and to three other widely used methodologies: multilayer perceptron (MLP), support vector machine (SVM), and Gaussian process (GP). As the experiments for both regression and classification illustrate, the proposed OP-ELM methodology performs several orders of magnitude faster…

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