Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors

Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite size effects in X-ray scattering. Various aspects of Scherrer-type grain-size analysis are discussed with regard to the characterization of thin films with grazing-incidence scattering methods utilizing area detectors. After a brief review of the basic features of Scherrer analysis, a description of resolution-limiting factors in grazing-incidence scattering geometry is provided. As an application, the CHESS D1 beamline is characterized for typical scattering modes covering length scales from the molecular scale to the nanoscale.

• NS
  National Science Foundation

  Awards: 0225180, DMR-0225180
• NI
  National Institutes of Health
• NI
  National Institute of General Medical Sciences

  Award: DMR-0225180
• DO
  Division of Materials Research

  Award: DMR-0225180