Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system
Rutgers, The State University of New Jersey
Abstract
One of the most frequently used methods for characterizing thin films is UV–Vis absorption. The near-edge region can be fitted to a simple expression in which the intercept gives the band-gap and the fitting exponent identifies the electronic transition as direct or indirect (see Tauc et al., Phys. Status Solidi 15, 627 (1966); these are often called “Tauc” plots). While the technique is powerful and simple, the accuracy of the fitted band-gap result is seldom stated or known. We tackle this question by refitting a large number of Tauc plots from the literature and look for trends. Nominally pure zinc oxide (ZnO) was chosen as a material with limited intrinsic deviation from stoichiometry and which has been…
Citation impact
- FWCI
- 20.36
- Percentile
- 100%
- References
- 129
Authors
4Topics & keywords
- Band gap
- Absorption edge
- Materials science
- Enhanced Data Rates for GSM Evolution
- Stoichiometry
- Figure of merit
- Plot (graphics)
- Thin film