articleSurface Science ReportsOct 1, 2005GREEN OA

Force measurements with the atomic force microscope: Technique, interpretation and applications

HBHans‐Jürgen ButtBCBrunero CappellaMKMichael Kappl

Max Planck Institute for Polymer Research · Federal Institute For Materials Research and Testing

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Abstract

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3

Topics & keywords

Topics
Keywords
  • Surface forces apparatus
  • Surface force
  • Hamaker constant
  • Nanotechnology
  • Kelvin probe force microscope
  • Elasticity (physics)
  • Atomic force microscopy
  • Chemistry
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