Critical assessment of charge mobility extraction in FETs
Rutgers, The State University of New Jersey · Pohang University of Science and Technology · +2 more institutions
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Abstract
No abstract available for this paper.
Citation impact
721
total citations
- FWCI
- 46.91
- Percentile
- 100%
- References
- 34
Citations per year
Authors
5- HHHyun Ho ChoiCorresponding
Rutgers, The State University of New Jersey, Pohang University of Science and Technology
- KCKilwon Cho
Pohang University of Science and Technology
- CDC. Daniel Frisbie
University of Minnesota
- HSHenning Sirringhaus
University of Cambridge
- VPVitaly Podzorov
Rutgers, The State University of New Jersey
Topics & keywords
Topics
Keywords
- Transistor
- Materials science
- Extraction (chemistry)
- Electron mobility
- Charge (physics)
- Organic semiconductor
- Semiconductor
- Field-effect transistor
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