A Digital-Twin-Assisted Fault Diagnosis Using Deep Transfer Learning

Digital twin is a significant way to achieve smart manufacturing, and provides a new paradigm for fault diagnosis. Traditional data-based fault diagnosis methods mostly assume that the training data and test data are following the same distribution and can acquire sufficient data to train a reliable diagnosis model, which is unrealistic in the dynamic changing production process. In this paper, we present a two-phase digital-twin-assisted fault diagnosis method using deep transfer learning (DFDD), which realizes fault diagnosis both in the development and maintenance phases. At first, the potential problems that are not considered at design time can be discovered through front running the ultra-high-fidelity…