Understanding memristive switching via in situ characterization and device modeling
Oak Ridge National Laboratory · University of Massachusetts Amherst · +2 more institutions
Abstract
Owing to their attractive application potentials in both non-volatile memory and unconventional computing, memristive devices have drawn substantial research attention in the last decade. However, major roadblocks still remain in device performance, especially concerning relatively large parameter variability and limited cycling endurance. The response of the active region in the device within and between switching cycles plays the dominating role, yet the microscopic details remain elusive. This Review summarizes recent progress in scientific understanding of the physical origins of the non-idealities and propose a synergistic approach based on in situ characterization and device modeling to investigate…
Citation impact
- FWCI
- 23.24
- Percentile
- 100%
- References
- 104
Authors
7- WSWen SunCorresponding
Oak Ridge National Laboratory, University of Massachusetts Amherst, Institute of Microelectronics, Tsinghua University
- BGBin Gao
Institute of Microelectronics, Tsinghua University
- MCMiaofang Chi
Oak Ridge National Laboratory
- QXQiangfei Xia
University of Massachusetts Amherst
- JJJ. Joshua Yang
University of Massachusetts Amherst
Topics & keywords
- Characterization (materials science)
- Commercialization
- Computer science
- Nanotechnology
- Memristor
- Materials science
- Electronic engineering
- Engineering