Journal of Intelligent Manufacturing

In electronics manufacturing, the required quality of electronic modules (e.g.packaged electronic devices) are evaluated through qualification testing using standards and user-defined requirements.The challenge for the electronics industry is that product qualification testing is time-consuming and costly.This paper focuses on the development and demonstration of a novel approach for smarter qualification using test data from the production line along with integrated computational techniques for data mining/analytics and data-driven forecasting (i.e.prognostics) modelling.The most common type of testing in the electronics industry-sequentially run electrical multi-parameter tests on the Device-under-Test…

• UO
  University of Greenwich