Physics-informed machine learning for reliability and systems safety applications: State of the art and challenges
University of Illinois Urbana-Champaign · University of Massachusetts Amherst
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Citation impact
318
total citations
- FWCI
- 34.77
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- 100%
- References
- 191
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5Topics & keywords
Topics
Keywords
- Reliability (semiconductor)
- Fidelity
- Computer science
- Physics of failure
- Data science
- Systems engineering
- Risk analysis (engineering)
- Machine learning
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