Review of: "FinFET nanotransistor, the reduction of scale causes more short channel effects, less gate control, an exponential increase in leakage currents, severe process changes, and power densities"
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Abstract
No abstract available for this paper.
Citation impact
462
total citations
- FWCI
- 88.29
- Percentile
- 100%
- References
- 13
Citations per year
Authors
1Topics & keywords
Topics
Keywords
- Leakage power
- Exponential function
- Leakage (economics)
- Reduction (mathematics)
- Short-channel effect
- Channel (broadcasting)
- Materials science
- Electrical engineering
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