articleReliability Engineering & System SafetyFeb 12, 2025Closed access

Physics-informed neural network supported wiener process for degradation modeling and reliability prediction

ZHZhongze HeSWShaoping WangJSJian ShiDLDi LiuXDXiaochuan Duan

Beihang University

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Citation impact

43
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FWCI
45.59
Percentile
100%
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78
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6

Topics & keywords

Topics
Keywords
  • Artificial neural network
  • Reliability (semiconductor)
  • Wiener process
  • Degradation (telecommunications)
  • Process (computing)
  • Reliability engineering
  • Computer science
  • Management science
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