Electron and X-Ray Spectroscopy Techniques

This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.