bookNov 17, 2017Closed access

Scanning Electron Microscopy and X-Ray Microanalysis

JIJoseph I. GoldsteinDEDale E. NewburyJRJoseph R. MichaelNWNicholas W. M. RitchieJHJohn Henry J. Scott

University of Massachusetts Amherst · National Institute of Standards and Technology · +2 more institutions

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Abstract

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5,201
total citations
FWCI
42.81
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100%
References
29
Citations per year

Authors

6

Topics & keywords

Topics
Keywords
  • Scanning electron microscope
  • Microanalysis
  • Scanning confocal electron microscopy
  • Microscopy
  • Materials science
  • X-ray
  • Analytical Chemistry (journal)
  • Optics
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