articleJournal of NeuroscienceMar 19, 2008BRONZE OA

Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling

GKGraham KnottHMHerschel M. MarchmanDSDavid S. WallBLBen Lich

École Polytechnique Fédérale de Lausanne · Janelia Research Campus

PubMed
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Abstract

### Introduction Analyzing the synaptic basis of neuronal circuits within a volume of brain tissue requires electron microscopy. With a resolution capable of seeing the smallest synaptic contacts, this method uses different sectioning techniques to produce serial images suitable for seeing the

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Topics & keywords

Topics
Keywords
  • Electron microscope
  • Focused ion beam
  • Materials science
  • Microscopy
  • Resolution (logic)
  • Brain tissue
  • Scanning electron microscope
  • Scanning confocal electron microscopy
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