Sub-ångstrom resolution using aberration corrected electron optics
IBM Research - Thomas J. Watson Research Center · IBM (United States) · +1 more institution
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898
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3Topics & keywords
Topics
Keywords
- Chromatic aberration
- Optics
- Electron optics
- Scanning transmission electron microscopy
- Resolution (logic)
- Electron
- Lens (geology)
- Materials science
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