bookJan 1, 2020Closed access

Advanced Computing in Electron Microscopy

EJEarl J. Kirkland

Cornell University

Indexed incrossref

Abstract

No abstract available for this paper.

Citation impact

812
total citations
FWCI
39.70
Percentile
100%
References
4
Citations per year

Authors

1

Topics & keywords

Topics
Keywords
  • Scanning transmission electron microscopy
  • Computation
  • Electron tomography
  • Computer science
  • Key (lock)
  • Transmission electron microscopy
  • Optics
  • Resolution (logic)
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