articleJournal of Electron Spectroscopy and Related PhenomenaApr 25, 2011Closed access

XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures

University of Oslo · SINTEF

Indexed incrossref

Abstract

No abstract available for this paper.

Citation impact

608
total citations
FWCI
6.42
Percentile
100%
References
73
Citations per year

Authors

6

Topics & keywords

Keywords
  • Lanthanum
  • X-ray photoelectron spectroscopy
  • Lanthanum oxide
  • Valence (chemistry)
  • Oxide
  • Hydroxide
  • Chemistry
  • Spectral line
UN Sustainable Development Goals
  • Affordable and clean energy
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