articleNatureMar 1, 2010Closed access

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

OLOndrej L. KrivanekMFMatthew F. ChisholmVNValeria NicolosiTJTimothy J. PennycookGCG.J. Corbin

Nion (United States) · Oak Ridge National Laboratory · +2 more institutions

PubMed
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1,341
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12

Topics & keywords

Topics
Keywords
  • Atom (system on chip)
  • Scanning transmission electron microscopy
  • Dark field microscopy
  • Boron nitride
  • Scanning tunneling microscope
  • Electron
  • Materials science
  • Transmission electron microscopy
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