Impact of sample storage type on adventitious carbon and native oxide growth: X-ray photoelectron spectroscopy study
Linköping University · Thinfilm (Sweden)
Abstract
The type and degree of contamination on surfaces intended for X-ray photoelectron spectroscopy (XPS) studies is considered decisive for meaningful and reliable analysis as in many cases in-situ cleaning methods are not applicable or otherwise undesired. We report on the effects of sample storage environment on predominantly carbon- and oxygen-containing species accumulating on the surfaces of fourteen types of thin film samples spanning group IVB-VIB transition metals (TMs), TM nitrides, and TM diborides. All specimens were deposited by magnetron sputtering and stored for six months in different common sample storage environments such as openly on a shelf in the office or XPS lab, or within a polypropylene…
Citation impact
- FWCI
- 20.34
- Percentile
- 100%
- References
- 29
Authors
2Topics & keywords
- X-ray photoelectron spectroscopy
- Oxide
- Carbon fibers
- Materials science
- Wafer
- Polyethylene
- Analytical Chemistry (journal)
- Chemical engineering