bookJan 1, 2003Closed access

Scanning Electron Microscopy and X-ray Microanalysis

JIJoseph I. GoldsteinDEDale E. NewburyPEPatrick EchlinDCDavid C. JoyCECharles E. Lyman

University of Massachusetts Amherst · National Institute of Standards and Technology · +5 more institutions

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Topics & keywords

Topics
Keywords
  • Microanalysis
  • Scanning electron microscope
  • Electron probe microanalysis
  • Scanning confocal electron microscopy
  • X-ray
  • Materials science
  • Microscopy
  • Analytical Chemistry (journal)
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