Practical guide for curve fitting in x-ray photoelectron spectroscopy
Brigham Young University · Illinois Institute of Technology · +6 more institutions
Abstract
The use of peak fitting to extract information from x-ray photoelectron spectroscopy (XPS) data is of growing use and importance. Due to increased instrument accessibility and reliability, the use of XPS instrumentation has significantly increased around the world. However, the increased use has not been matched by the expertise of the new users, and the erroneous application of curve fitting has contributed to ambiguity and confusion in parts of the literature. This guide discusses the physics and chemistry involved in generating XPS spectra, describes good practices for peak fitting, and provides examples of appropriate use along with tools for avoiding mistakes.
Citation impact
- FWCI
- 24.32
- Percentile
- 100%
- References
- 50
Authors
7- GHGeorge H. MajorCorresponding
Brigham Young University, Illinois Institute of Technology, University of Washington, Teignmouth Community Hospital, Applied Physical Electronics (United States)
- NFNeal Fairley
Brigham Young University, Illinois Institute of Technology, University of Washington, Teignmouth Community Hospital, Applied Physical Electronics (United States)
- PMPeter M. A. Sherwood
Brigham Young University, Illinois Institute of Technology, University of Washington, Teignmouth Community Hospital, Applied Physical Electronics (United States)
- MRMatthew R. Linford
Brigham Young University, Illinois Institute of Technology, University of Washington, Teignmouth Community Hospital, Applied Physical Electronics (United States)
- JTJeff Terry
Brigham Young University, Illinois Institute of Technology, University of Washington, Teignmouth Community Hospital, Applied Physical Electronics (United States)
Topics & keywords
- X-ray photoelectron spectroscopy
- Confusion
- Ambiguity
- Curve fitting
- Instrumentation (computer programming)
- Spectral line
- Analytical Chemistry (journal)
- Computer science